Evaluation of Ni/Mn multilayer samples with glancing-incidence and take-off X-ray fluorescence analysis |
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| Authors: | S. Sato K. Tsuji K. Hirokawa |
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| Affiliation: | (1) Institute for Advanced Materials Processing, Tohoku University, 980-77 Sendai, Japan;(2) Institute for Materials Research, Tohoku University, 980 Sendai, Japan |
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| Abstract: | A Glancing-Incidence and Take-off X-Ray Fluorescence (GIT-XRF) apparatus with which both incident angle of primary X-ray and take-off angle of fluorescent X-rays can be controlled has been newly developed for characterizing surfaces and interfaces. Using this apparatus, Ni/Mn multilayer samples were evaluated obtaining Take-off-Angle-Dependent X-Ray Fluorescence (TAD-XRF) curves at arbitrary incident angles of primary X-ray. In particular, we could obtain information on the near surface by measuring TAD-XRF curves at the incident angle less than the critical angle of total reflection for primary X-rays. |
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| Keywords: | 07.85. + n 68.35. - p 68.65. + g |
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