High E-field microwave properties of bulk amorphous semiconductors |
| |
Authors: | E.H. Staiger R.J. Gutmann J.M. Borrego |
| |
Affiliation: | Department of Electrical Engineering Technology, State University of New York, Agricultural and Technical College, Alfred, New York 14802, USA;Electrophysics and Electronic Engineering Division, Rensselaer Polytechnic Institute, Troy, New York 12181, USA |
| |
Abstract: | ![]() The effects of high microwave electric fields on bulk amorphous semiconductors were studied at room temperature. Samples of eight different glasses were mounted in the center of a reduced height, X-band waveguide in a sandwich geometry parallel to the electric field of the dominant mode. Samples were 90 mil (2.286 mm) square by 8.5 mil (0.2159 mm) thick with thin-film CrAu electrodes. The microwave conductivity remained constant at field strengths below a critical value near 104V/cm. Above this value, which depends upon the microwave pulse length, switching to a low-resistance state was observed with the thermal breakdown as the switching initiation mechanism. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|