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High E-field microwave properties of bulk amorphous semiconductors
Authors:E.H. Staiger  R.J. Gutmann  J.M. Borrego
Affiliation:Department of Electrical Engineering Technology, State University of New York, Agricultural and Technical College, Alfred, New York 14802, USA;Electrophysics and Electronic Engineering Division, Rensselaer Polytechnic Institute, Troy, New York 12181, USA
Abstract:
The effects of high microwave electric fields on bulk amorphous semiconductors were studied at room temperature. Samples of eight different glasses were mounted in the center of a reduced height, X-band waveguide in a sandwich geometry parallel to the electric field of the dominant mode. Samples were 90 mil (2.286 mm) square by 8.5 mil (0.2159 mm) thick with thin-film CrAu electrodes. The microwave conductivity remained constant at field strengths below a critical value near 104V/cm. Above this value, which depends upon the microwave pulse length, switching to a low-resistance state was observed with the thermal breakdown as the switching initiation mechanism.
Keywords:
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