Energy loss measurements and electronic properties of thianthren |
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Authors: | A. Arena R. Girlanda G. Martino F. Neri G. Saitta |
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Affiliation: | (1) Istituto di Struttura della Materia dell'Università, Salita Sperone 31, I-98166 Sant'Agata, Messina, Italia |
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Abstract: | Summary The dielectric and electronic properties of thianthren (C6H4(S)2H4C6) are determined by means of optical reflectivity, absorption measurements and reflection electron energy loss spectroscopy. The experimental results are interpreted on the basis of a Complete Neglect of Differential Overlap (CNDO) calculation used in three different parametrization schemes. Emphasis is laid on the discussion of the problems which generally affect the analysis of electron energy loss spectra, and a procedure to obtain the complex dielectric function from electron energy loss measurements performed in the reflection mode is suggested. Work partially supported by the MURST through the GNSM. |
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Keywords: | Conductivity phenomena in semiconductors and insulators |
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