Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au+, Au and Au ions

In recent years, Au‐cluster ions have been successfully used for organic analysis in secondary ion mass spectrometry. Cluster ions, such as Au and Au, can produce secondary ion yield enhancements of up to a factor of 300 for high mass organic molecules with minimal sample damage. In this study, the potential for using Au⁺, Au and Au primary ions for the analysis of inorganic samples is investigated by analyzing a range of silicate glass standards. Practical secondary ion yields for both Au and Au ions are enhanced relative to those for Au⁺, consistent with their increased sputter rates. No elevation in ionization efficiency was found for the cluster primary ions. Relative sensitivity factors for major and trace elements in the standards showed no improvement in quantification with Au and Au ions over the use of Au⁺ ions. Higher achievable primary ion currents for Au⁺ ions than for Au and Au allow for more precise analyses of elemental abundances within inorganic samples, making them the preferred choice, in contrast to the choice of Au and Au for the analysis of organic samples. The use of delayed secondary ion extraction can also boost secondary ion signals, although there is a loss of overall sensitivity. Copyright © 2009 John Wiley & Sons, Ltd.