Raman spectra and structure of multicomponent oxide planar waveguides prepared by sol-gel

This work was aimed at understanding the structure of SiO₂–MO₂ (M = Ti, Zr, Hf) and SiO₂–HfO₂–MO₂ (M = Ti, Zr) materials, used as mixed oxide glass hosts for Er³⁺ ions in the fabrication of optical planar waveguides by sol-gel processing. This structural study was performed by Waveguide Raman Spectroscopy (WRS), complemented with X-ray diffraction (XRD). The admixture of TiO₂ to HfO₂, SiO₂–HfO₂ and HfO₂–ZrO₂ compositions was found to cause precipitation of nanocrystals of tetragonal HfO₂ or ZrO₂, or the formation of hafnia-titania mixed crystals, depending on the HfO₂/TiO₂ molar ratio.