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The role of carbon impurities on the Si(0 0 1)-c(4 × 4) surface reconstruction: Theoretical calculations
Authors:R. Miotto  A.C. Ferraz
Affiliation:a Centro de Ciências Naturais e Humanas, Universidade Federal do ABC, Rua Santa Adelia 166, CEP 09210-170, Santo André, SP, Brazil
b Instituto de F?´sica da Universidade de São Paulo, Caixa Postal 66318, CEP 05314-970, São Paulo, SP, Brazil
Abstract:In this work we employ the state-of-the-art pseudopotential method, within a generalized gradient approximation to the density functional theory, combined with a recently developed method for the calculation of HREELS spectra to study a series of different proposed models for carbon incorporation on the silicon (0 0 1) surface. A fully discussion on the geometry, energetics and specially the comparison between experimental and theoretical STM images and electron energy loss spectra indicate that the Si(1 0 0)-c(4 × 4) is probably induced by Si-C surface dimers, in agreement with recent experimental findings.
Keywords:Density functional theory   Chemisorption   Surface electronic phenomena   Carbon   Silicon
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