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| OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY | |
| 引用本文： | Xin-huaDai Zhi-gangWang BoXiao Yong-junZhang ChenWang Chun-liBai Xiao-liZhang JianXu. OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY[J]. 高分子科学, 2004, 0(2): 117-122 |
| 作者姓名： | Xin-huaDai Zhi-gangWang BoXiao Yong-junZhang ChenWang Chun-liBai Xiao-liZhang JianXu |
| 作者单位： | [1]StateKeyLaboratoryofPolymerPhysicsandPolymerChemistry [2]TheCenterforMolecularSciences,InstituteofChemistry,ChineseAcademyofSciences,Beijing100080,China |
| 摘 要： | Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes, at low concentrations, can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution. The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present. |
| 关 键 词： | DNA 变性 伸展结构 AFM 原子力显微镜 |
| 收稿时间： | 2003-07-22 |
| 修稿时间： | 2003-08-22 |
OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY* |
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| Xin-hua Dai,Zhi-gang Wang,Bo Xiao,Yong-jun Zhang,Chen Wang,Chun-li Bai,Xiao-li Zhang,Jian Xu. OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY*[J]. Chinese Journal of Polymer Science, 2004, 0(2): 117-122 | |
| Authors: | Xin-hua Dai Zhi-gang Wang Bo Xiao Yong-jun Zhang Chen Wang Chun-li Bai Xiao-li Zhang Jian Xu |
| Affiliation: | 1.State Key Laboratory of Polymer Physics and Polymer Chemistry,2.The Center for Molecular Sciences, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080, China |
| Abstract: | Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes, at low concentrations, can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution.The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present. |
| Keywords: | DNA Denaturation Extended-structure AFM ATOMIC FORCE MICROSCOPY DENATURATION PARTIAL high resolution available technique present binding display extended rather structure spread surface concentrations HOPG complexes ordered graphite CTAB |
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