Exchange bias in thin-film (Co/Pt)3/Cr2O3 multilayers |
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Authors: | S.-H. Lim M. Murakami A.J. Zambano I. Takeuchi |
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Affiliation: | a Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742, USA b Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, USA |
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Abstract: | We have fabricated exchange-biased Co/Pt layers ((0.3 nm/1.5 nm)×3) on (0 0 1)-oriented Cr2O3 thin films. The multilayered films showed extremely smooth surfaces and interfaces with root mean square roughness of ≈0.3 nm for 10 μm×10 μm area. The Cr2O3 films display sufficient insulation with a relative low leakage current (1.17×10−2 A/cm2 at 380 MV/m) at room temperature which allowed us to apply electric field as high as 77 MV/m. We find that the sign of the exchange bias and the shape of the hysteresis loops of the out-of-plane magnetized Co/Pt layers can be delicately controlled by adjusting the magnetic field cooling process through the Néel temperature of Cr2O3. No clear evidence of the effect of electric field and the electric field cooling was detected on the exchange bias for fields as high as 77 MV/m. We place the upper bound of the shift in exchange bias field due to electric field cooling to be 5 Oe at 250 K. |
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Keywords: | Exchange bias Cr2O3 Magnetoelectric Thin film Multilayer |
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