Error minimization in the envelope method for the determination of optical constants of a thin film |
| |
Authors: | Meenakshi Kar |
| |
Institution: | Division of Electronic Materials, National Physical Laboratory, K. S. Krishnan Road, New Delhi 110012, India |
| |
Abstract: | The algorithm for the determination of optical constants of a weakly absorbing thin film from the envelope method has been modified to minimize the error in the estimated values of extinction coefficient (k) as a function of wavelength. The refinement procedure is based on an extension of interference order adjustment method used for improving the estimated values of film thickness d and wavelength‐dependent refractive index n from the envelope method. The proposed modification when applied to a hypothetical as well as an experimental film is found to work well over a wide spectral region. Copyright © 2010 John Wiley & Sons, Ltd. |
| |
Keywords: | thin film optical constants refractive index extinction coefficient envelope method transmittance |
|
|