Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films |
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| Authors: | D. Haskel E. Kravtsov Y. Choi J. C. Lang Z. Islam G. Srajer J. S. Jiang S. D. Bader P. C. Canfield |
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| Affiliation: | 1.Advanced Photon Source,Argonne National Laboratory,Argonne,USA;2.Institute of Metal Physics,Russian Academy of Sciences, and Ural Federal University,Ekaterinburg,Russia;3.Materials Science Division,Argonne National Laboratory,Argonne,USA;4.Department of Physics and Ames Laboratory,Iowa State University,Iowa,USA |
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| Abstract: | The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10−2–10−6 I c ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I c . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films. |
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