Electron microscopy of oriented high-density polyethylene: Comparison with small-angle X-ray scattering

The morphology of cold-drawn, rolled and annealed high-density polyethylene was investigated by transmission electron microscopy of stained sections. From the electron micrographs, a model of the structure was developed and the scattering pattern calculated. This was then compared with the corresponding small-angle X-ray scattering (SAXS) pattern, in order both to aid in the interpretation of SAXS patterns of oriented polymers, and to assess the effects of staining with chlorosulphonic acid on the morphology.