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X-ray studies of dislocations in multi-layer Cu films |
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| Authors: | S. Zwui S. Li H. Guan |
| Affiliation: | (1) Physics Department, Jilin University, 130023 Changchun, People's Republic of China |
| Abstract: | Vacuum-prepared multi-layer Cu films have been studied by x-ray diffraction to detect the averaged dislocation density and distribution. There are very few stacking faults and a very small degree of texture in the films. |
| Keywords: | 61.70 |
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