Relaxation processes on A ZnO surface irradiated by electrons |
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Authors: | M. M. Mikhailov |
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Affiliation: | (1) S. M. Kirev Nuclear Physics Scientific-Research Institute, Tomsk State University, USSR |
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Abstract: | ![]() The dependence of effective charge carrier lifetime and the surface conductivity relaxation constant of polycrystalline zinc oxide as functions of electron irradiation dosage at constant residual gas pressure, partial oxygen pressure at constant irradiation dosage, and partial water vapor pressure at constant irradiation dosage are studied. Surface state types and the charge carrier relaxation mechanism are determined.Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 6, pp. 81–85, June, 1985. |
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