The Feasibility of Combined NAA and Neutron Diffraction

By employing neutron (or X-ray) diffraction, the structure of crystalline materials can be determined. However, if an impurity in the crystal is present in concentrations below, say, 1·10^–4, its influence cannot be observed in the diffraction patterns. If the impurity present at low concentrations is to be localized, a signal uniquely attributable to the impurity must be obtained. In this paper, two such methods, based on the same principles as the "X-ray standing wave" technique, are proposed for neutrons.