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Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques
Authors:C. Hugenschmidt  A. Bauer  P. Böni  H. Ceeh  S. W. H. Eijt  T. Gigl  C. Pfleiderer  C. Piochacz  A. Neubauer  M. Reiner  H. Schut  J. Weber
Affiliation:1. Physik Department E21, Technische Universit?t München, Garching, Germany
2. Heinz Maier-Leibnitz Zentrum (MLZ), FRM II, Technische Universit?t München, Garching, Germany
3. Department of Radiation Science and Technology (RST), Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands
Abstract:
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