(1) Centro de Investigaciones en Optica A.C., Apdo. Postal I-948, CP 37000 Leon, Guanajuato, Mexico;(2) Department of Mechanical Engineering, Loughborough University of Technology, LE11 3TU Loughborough, Leics, UK
Abstract:
Electronic-speckle-pattern interferometry and moiré interferometry have been used to calculateK1 andJ for compact tension specimens. Automated-fringe-pattern analysis enables the full-field of data to be used with the minimum of operator intervention. Measurements are shown to be accurate to within 10 percent. TheJ-measurement procedure employed could form the basis of an automatic-fault detection system.