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Low-temperature synthesis and characteristics of fractal graphene layers |
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| Authors: | Narek Margaryan Ninel Kokanyan Edvard Kokanyan |
| Affiliation: | 1. Department of Physics, National Polytechnic University of Armenia, Teryan 105, Yerevan, Armenia;2. Université de Lorraine, Laboratoire Matériaux Optiques, Photonique et Systèmes, Metz F-57070, France;3. Laboratoire Matériaux Optiques, Photonique et Systèmes, CentraleSupélec, Université Paris-Saclay, Metz F-57070, France;4. Armenian State Pedagogical University after Kh. Abovyan, 17 Tigran Mets Ave., Yerevan 0010, Armenia;5. Institute for Physical Research, National Academy of Sciences of Armenia, Ashtarak-2, 0203, Armenia |
| Abstract: | Large scale fractal graphene layers are obtained by complex method of liquid phase exfoliation and self-organization. Atomic force microscopy (AFM) is used to study the surface properties of formed layers and to assess their thickness. Surface potential of graphene and potential transition between the graphene and substrate is measured by Kelvin probe method. The influence of the effect of dielectric confinement on the optical properties of graphene is discussed in this work. Raman scattering spectra were used for structural analysis and assessment of the level of defects. Current-voltage characteristics of graphene ribbons were measured and discussed for different number of layers. |
| Keywords: | Graphene AFM Absorption Raman spectroscopy Current-voltage characteristic |
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