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The effect of metal dispersion on the resonance of antennas at infrared frequencies
Authors:Francisco Javier González  Javier Alda  Jorge Simón  James Ginn  Glenn Boreman
Affiliation:1. Instituto de Investigación en Comunicación Óptica, Universidad Autónoma de San Luis Potosí, Álvaro Obregón 64, 78000 San Luis Potosí, SLP, Mexico;2. Applied Optics Complutense Group, University Complutense of Madrid, School of Optics, Av. Arcos de Jalon s/n, 28037 Madrid, Spain;3. School of Optics/CREOL, University of Central Florida, 4000 Central Florida Blvd., Orlando, FL 32816-2700, USA;1. Department of Physics, University College of Science, Osmania University, Hyderabad 500 007, India;2. Central Instruments Laboratory, University of Hyderabad, Hyderabad 500046, India;1. Department of Chemistry, Bates College, Dana Chemistry Hall, Lewiston, ME 04240, United States;2. Forest Bioproducts Research Institute, University of Maine, Orono, ME 04469, United States;3. Laboratory for Surface Science and Technology, University of Maine, Orono, ME 04469, United States;4. Department of Chemistry, University of Maine, Aubert Hall, Orono, ME 04469, United States;5. Department of Physics and Astronomy, University of Maine, Bennett Hall, Orono, ME 04469, United States;6. Department of Chemical and Biological Engineering, University of Maine, Jenness Hall, Orono, ME 04469, United States;1. School of Electrical and Electronic Engineering, East China Jiaotong University, Nanchang Jiangxi 330013, PR China;2. Guilin University of Aerospace Technology, Guangxi, Guilin 541004, PR China;3. School of Electronic Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, PR China;4. Shool of Information Engineering College, Jimei University, Xiamen, Fujian 361005, PR China;5. Xiamen University, Xiamen, Fujian 361005, PR China;1. School of Physics and Engineering, Henan University of Science and Technology, Luoyang 471003, China;2. National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China;1. INFN Sezione di Pisa, Largo B. Pontecorvo 3, 56127 Pisa, Italy;2. Università di Pisa, Dipartimento di Fisica, Largo B. Pontecorvo 3, 56127 Pisa, Italy;3. Scuola Normale Superiore, Piazza dei Cavalieri 7, 56126 Pisa, Italy;4. INFN Sezione di Genova and Università degli studi di Genova, Via Dodecaneso 33, 16146 Genova, Italy
Abstract:
In this paper the optical parameters at infrared frequencies of metallic thin films were obtained experimentally using a variable angle spectroscopic ellipsometer and used to simulate numerically the frequency response of antennas and antenna-coupled detectors at infrared frequencies (5–15 μm). The simulation results agree with previously published data and practical guidelines are presented for the design and fabrication of dipole and bowtie antennas at infrared frequencies.
Keywords:
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