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Throughput Measurement of a Multilayer-Coated Schwarzschild Objective Using Synchrotron Radiation |
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| Authors: | Takanori Kiyokura Fumihiko MAEDA Yoshio Watanabe Yoshinori Iketaki Koumei Nagai Yoshiaki Horikawa Masaharu Oshima Eiji Shigemasa Akira Yagishita |
| Affiliation: | (1) NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan;(2) Olympus Optical Co., Ltd., 2-3 Kuboyamacho, Hachioji, Tokyo 192-8512, Japan;(3) Department of Applied Chemistry, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan;(4) High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan |
| Abstract: | The throughput of a Schwarzschild objective using undulator synchrotron radiation was measured. Conventionally, the throughput was estimated from the squared reflectivity of one multilayer mirror and from the obstruction ratio. However, we evaluated the transmission ratio from the input and output photon flux using a precisely calibrated monochromatic beam from an undulator light source. It was found that the objective has a maximum throughput of 8.5% at a wavelength of 13.9 nm. |
| Keywords: | Schwarzschild objective multilayer synchrotron radiation throughput soft X-ray, monochromator |
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