Measurement of out-of-plane static and dynamic deformations by processing digital speckle pattern interferometry fringes using wavelet transform |
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Authors: | Rajesh Kumar I P Singh Chandra Shakher |
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Institution: | Laser Applications and Holography Laboratory, Instrument Design Development Centre, Indian Institute of Technology, Delhi, New Delhi 110 016, India |
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Abstract: | In this paper, we are presenting measurement of static and dynamic deformations in rectangular plate fixed at one end using digital speckle pattern interferometry (DSPI). To improve the measurement accuracy, we have developed a new filtering scheme based on combination of average/median filtering and Symlet wavelet filtering which enhances the signal-to-noise ratio (SNR) in the speckle interferogram obtained from DSPI. Experimental results show that our filtering scheme is quite effective in improving SNR of the speckle interferogram. The measurements by DSPI and calculations from beam theory in the case of out-of-plane static deformation and the measurements by DSPI and accelerometer in the case of dynamic deformation are in good agreement. |
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Keywords: | Digital speckle pattern interferometry (DSPI) Deformations Signal-to-noise ratio (SNR) Histogram equalization Symlet wavelet |
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