Sensitivity of surface resistance measurement of HTS thin films by cavity resonator, dielectric resonator and microstrip line resonator |
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Authors: | N D Kataria Mukul Misra R Pinto |
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Affiliation: | (1) Superconductivity Division, National Physical Laboratory, 110 012 New Delhi, India;(2) Research Center for Superconductor Photonics, Osaka University, 565 0871 Osaka, Japan;(3) Tata Institute of Fundamental Research, Homi Bhabha Road, 400 005 Mumbai, India |
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Abstract: | ![]() Microwave surface resistance (R s) of silver-doped YBa2Cu3O7-δ (YBCO) thin film, deposited by laser ablation technique on 10 mm × 10 mm LaAlO3 substrate, has been measured by resonant techniques in the frequency range from 5 GHz to 20 GHz. The geometrical factor of the sample and the resonator has been determined theoretically by the knowledge of the electromagnetic field distribution in the resonators. The microwave surface resistance of the superconducting sample is then extracted from the measured Q value as a function of temperature. The sensitivity of the R s measurement, that is, the relative change in the Q value with the change in the R s value is determined for each resonator. |
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Keywords: | Microwave surface resistance high-temperature superconductors |
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