Linear polarization scans for resonant X‐ray diffraction with a double‐phase‐plate configuration

An in‐vacuum double‐phase‐plate diffractometer for performing polarization scans combined with resonant X‐ray diffraction experiments is presented. The use of two phase plates enables the correction of some of the aberration effects owing to the divergence of the beam and its energy spread. A higher rate of rotated polarization is thus obtained in comparison with a system with only a single retarder. Consequently, thinner phase plates can be used to obtain the required rotated polarization rate. These results are particularly interesting for applications at low energy (e.g. 4 keV) where the absorption owing to the phase plate(s) plays a key role in the feasibility of these experiments. Measurements by means of polarization scans at the uranium M₄ edge on UO₂ enable the contributions of the magnetic and quadrupole ordering in the material to be disentangled.