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Study of silica supported PtxNi1-x catalysts by ion scattering spectroscopy
Authors:Martine Borrell  Andreas Jentys  Peter Varga
Institution:(1) Institut für Allgemeine Physik, Technische Universität Wien, Wiedner Hauptstr. 8-10, A-1040 Wien, Austria;(2) Institut für Physikalische Chemie, Technische Universität Wien, Getreidemarkt 9, A-1060 Wien, Austria
Abstract:As supported PtxNi1–x catalysts are used for hydrogenation reactions, it seemed necessary to assess the surface composition of the reduced samples. To approach the usual reduction conditions we applied in situ reduction in a reaction chamber (1 mbar H2 up to 500 °C) placed in ultra high vacuum recipient (UHV: 10–9 to 2.10–10mbar). All ion scattering spectroscopy measurements were performed in UHV. Charging of the samples was avoided by electron bombardment (5 eV). The variation of the surface composition was determined after subsequent sputtering, thermal treatment at 500 °C and during oxygen adsorption. A comparison with previous results of surface compositions of binary alloys (polycrystalline foils 1, 2] and single crystals PtxNi1–x 3]) is given.Dedicated to Professor Dr. rer. nat. Dr. h. c. Hubertus Nickel on the occasion of his 65th birthday
Keywords:Pt  Ni  SiO2  supported catalysts  ion scattering spectroscopy
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