Two calculation procedures for the determination of composition and mass thickness of thin samples by x-ray spectrometry |
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| Authors: | J.H.H.G. Van Willigen H.T. Weber M. Bos W.E. Van Der Linden |
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| Affiliation: | Department of Chemical Technology, Twente University of Technology, EnschedeThe Netherlands |
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| Abstract: | ![]()
Two procedures are described for calculating the composition and mass thickness of thin samples from measured x-ray intensities. One procedure is suitable for use with a programmable hand calculator but gives correct results only for very thin samples. The other procedure utilizes the NRLXRF program and produces correct results for thin and thick films. |
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