|
|||||
|
|
| 用CMOS线阵图像传感器测量透明材料的折射率 | |
| 引用本文： | 车树良,张洪欣,陈思勤. 用CMOS线阵图像传感器测量透明材料的折射率[J]. 物理实验, 2007, 27(10): 7-10 |
| 作者姓名： | 车树良 张洪欣 陈思勤 |
| 作者单位： | 1. 中央民族大学,物理与电子工程学院,北京,100081 2. 北京邮电大学,电子工程学院,北京,100876 |
| 摘 要： | 将衍射光栅干涉和CMOS线阵图像传感器技术相结合,提出了自动测量透明材料折射率的方法.介绍了用CMOS线阵图像传感器来实现透明材料折射率测量的基本原理和数据采集方法.采用曲线拟合计算条纹移动距离,提高了对干涉条纹移动量测量的准确性,折射率精度可提高到10-5数量级. |
| 关 键 词： | 折射率 透明材料 CMOS线阵图像传感器 干涉条纹 |
| 文章编号： | 1005-4642（2007）10-0007-04 |
| 修稿时间： | 2007-07-08 |
Measuring refraction index of transparent materials using CMOS image sensor |
|
| CHE Shu-liang,ZHANG Hong-xin,CHEN Si-qin. Measuring refraction index of transparent materials using CMOS image sensor[J]. Physics Experimentation, 2007, 27(10): 7-10 | |
| Authors: | CHE Shu-liang ZHANG Hong-xin CHEN Si-qin |
| Abstract: | Based on the interference of diffraction grating and the technology of CMOS linear image sensor,the refraction index of transparent materials is measured automatically.First,the fundamentals of CMOS linear image sensor is analyzed and the introduction about data sampling is given.Then,the method to compute the displacement of the interference stripe is presented using curve fitting of the data.With this method,the measurement accuracy of the displacement of the interference stripe is improved.The precision of the refraction index can reach 10-5. |
| Keywords: | refraction index transparent materials CMOS linear image sensor interference stripe |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |