1.Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”,Russian Academy of Sciences,Moscow,Russia;2.National Research Centre “Kurchatov Institute,”,Moscow,Russia
Abstract:
A technique for recording rocking curves using an X-ray optical bending element is proposed to study the changes in the defect structure of single crystals under external impacts. The technique has been approved for a silicon crystal under a uniaxial mechanical load.