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Toward automatic evaluation of defect detectability in infrared images of composites and honeycomb structures
Institution:1. Pontificia Universidad Javeriana, Dpt. of Electronics and Computer Science, Calle 18 No 118-250, Cali, Colombia;2. Computer Vision and Systems Laboratory, Dpt. of Electrical and Computer Engineering, Laval University, Quebec City, Canada;1. Ecole des Mines de Douai, Département Informatique et Automatique, 941 Rue Charles Bourseul, 59508 Douai Cedex, France;2. Federal University of Paraná, Department of Mechanical Engineering, Centro Politécnico, 81531990 Curitiba PR, Brazil;3. Siemens Industry Software, Simulation and Test Solutions, Interleuvenlaan 68, B-3001 Heverlee, Belgium;4. KU Leuven, Department of Mechanical Engineering, Celestijnenlaan 300 B, B-3001 Heverlee, Belgium;1. Department of Radiation Oncology, Universitätsklinikum Erlangen, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Universitaetsstraße 27, 91054 Erlangen, Germany;2. Department of Radiology, Universitätsklinikum Erlangen, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Maximiliansplatz 3, 91054 Erlangen, Germany;3. Department of Neuroradiology, Universitätsklinikum Erlangen, Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU), Schwabachanlage 6, 91054 Erlangen, Germany
Abstract:Non-destructive testing (NDT) refers to inspection methods employed to assess a material specimen without impairing its future usefulness. An important type of these methods is infrared (IR) for NDT (IRNDT), which employs the heat emitted by bodies/objects to rapidly and noninvasively inspect wide surfaces and to find specific defects such as delaminations, cracks, voids, and discontinuities in materials. Current advancements in sensor technology for IRNDT generate great amounts of image sequences. These data require further processing to determine the integrity of objects. Processing techniques for IRNDT data implicitly looks for defect visibility enhancement. Commonly, IRNDT community employs signal to noise ratio (SNR) to measure defect visibility. Nonetheless, current applications of SNR are local, thereby overseeing spatial information, and depend on a-priori knowledge of defect’s location. In this paper, we present a general framework to assess defect detectability based on SNR maps derived from processed IR images. The joint use of image segmentation procedures along with algorithms for filling regions of interest (ROI) estimates a reference background to compute SNR maps. Our main contributions are: (i) a method to compute SNR maps that takes into account spatial variation and are independent of a-priori knowledge of defect location in the sample, (ii) spatial background analysis in processed images, and (iii) semi-automatic calculation of segmentation algorithm parameters. We test our approach in carbon fiber and honeycomb samples with complex geometries and defects with different sizes and depths.
Keywords:Infrared inspection  Infrared image processing  Defect detectability  Signal to noise ratio  Mean shift segmentation
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