Inversion domains and parallel growth in ammonothermally grown GaN crystals |
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Authors: | Buguo Wang Michael Suscavage David F. Bliss J. Jimenez |
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Affiliation: | 1. Solid State Scientific Corporation, 27-2 Wright Road, Hollis, NH 03049, USA;2. Sensors Directorate, Air Force Research Laboratory, Hanscom AFB, MA 01731, USA;3. Dpto. Física Materia Condensada – Universidad de Valladolid, Valladolid 47011, Spain |
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Abstract: | Macro-defects such as twins, inversion domains, crevices, and columnar growth occasionally appear in ammonothermally grown GaN crystals. Twinning mechanisms and parallel growth are proposed to explain the formation of these defects. As a polar crystal with wurtzite structure, GaN can have several different kinds of twins depending on the polarity arrangement of each individual twin. Inversion domains are formed in one of the twinning mechanisms. Parallel growth is used to explain the formation of pits on the nitrogen face and the columnar growth on the gallium face. Etching in hot H3PO4 is used to reveal the polarities and defects of GaN crystals when they are indistinguishable. Optical microscopy, scanning electron microscope, and cathodoluminescence are also employed to study these defects. In addition, seed quality, avoidance of macro-defect formation, and impurity effects are also discussed. |
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Keywords: | A1. The ammonothermal technique A1. Crystal growth A2. GaN B1. Inversion domain B1. Crystallographic polarity B1. Twins |
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