ARXPS-analysis and morphology of sputtered nanocrystalline TiC/SiC coatings |
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Authors: | B. Hornetz H.-J. Michel J. Halbritter |
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Affiliation: | (1) Kernforschungszentrum Karlsruhe, IMF 1, Postfach 3640, D-76021 Karlsruhe, Germany;(2) Universität Karlsruhe, D-76021 Karlsruhe, Germany |
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Abstract: | ARXPS (angle resolved X-ray photoelectron spectroscopy) measurements are used to obtain informations about surfaces and grain boundaries. Data acquired from nanocrystalline carbidic hard coatings have been employed to establish structural models. Magnetron-sputtered coatings of TiC, SiC and TiC/SiC were examined. In such coatings, partly defective TiC nanocrystallites are surrounded by interfacial carbide. This excess carbon shows a binding state similar to that of doped graphite or fullerenes. X-ray amorphous SiC is found in the residue. On top of sputtered SiC coatings, less oxide and graphite is found as compared to TiC/SiC or TiC coatings. |
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