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A plasma resonance study of valley transfer in (001) Si inversion layers
Authors:Th. Englert  D.C. Tsui  R.A. Logan
Affiliation:Bell Laboratories, Murray Hill, NJ 07974, U.S.A.
Abstract:
We observed the two-dimensional plasmons of the two-component electron plasma in the (001) Si-inversion layer resulting from simultaneous population of the [001] valley, E0, and the [010] valley, E0′, subbands under a compressional uniaxial stress along [010]. Our data show an onset of electron transfer from E0 to E0′ at X = (1.4 ± 0.1) kbar for n = 1.67 × 1012 cm?2 and X = (1.2 ± 0.2) kbar for n = 2.60 × 1012 cm?2, consistent with the theory of Takada and Ando that includes the electron-electron correlation effects.
Keywords:
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