| Characteristics of Photoelectron Decay of Silver Halide Microcrystal Illuminated by a Short Pulse Laser |
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| 作者姓名： | 杨光鹏 李晓苇 等 |
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| 作者单位： | CollegeofPhysicsScience＆Technology,HebeiUniversity,Baoding071002 |
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| 摘 要： | A YAG supershort pulse laser (355nm,35ps) is used as an exposure source and the microwave dielectric spectri, technique is used to quickly detect the photoelectron decay process in AgX microcrystals,because the free photoelectron lifetime and decay process can decide the sensitivity and other efficiencies of silver halide material.The result shows that the free photoelectron average lifetimes of Kodak-100 and Fuji-100 colour film samples are 8.5 and 9.5 ns,respectively.
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| 关 键 词： | AgX微晶体 卤化银微结构 短脉冲激光照射 电性质 |
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