Development of a Micro-beam Method to Investigate the Fatigue Crack Growth Mechanisms of Submicron-scale Cracks |
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Authors: | Y Yang H H Ruan J Lu N Yao W L Shan W O Soboyejo |
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Institution: | (1) Department of Mechanical Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China;(2) Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, NJ 08544, USA;(3) Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, NJ 08544, USA |
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Abstract: | In this paper, we propose a new experimental method to investigate the fatigue crack growth mechanisms of submicron-scale
cracks by using freestanding single edge notched micro-beams that are fabricated on the surfaces of conventional bending specimens
with the focused ion beam technique. Three dimensional FEM simulations in conjugate with LEFM fracture analysis were carried
out to correlate the applied far field stresses with the local crack-tip driving force. For the validation of the new method,
micro-beam experiments were conducted on 4340 low alloy steels and the results showed the similar findings compared to those
in the literature while revealed undiscovered fatigue damage mechanisms that took place at the submicron and nanometer scales. |
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Keywords: | Fatigue Fatigue tests Steels Focused ion beam (FIB) |
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