The molecular orientation of DNA bases on H-passivated Si(1 1 1) surfaces investigated by means of near edge X-ray absorption fine structure spectroscopy |
| |
Authors: | Stefan Seifert Gianina N. Gavrila Walter Braun |
| |
Affiliation: | a Institut für Physik, Technische Universität Chemnitz, D-09107 Chemnitz, Germany b BESSY GmbH, Albert-Einstein-Str. 15, D-12489 Berlin, Germany |
| |
Abstract: | ![]() Layers of the DNA bases adenine, cytosine, and guanine were deposited onto hydrogen passivated Si(1 1 1) surfaces. The average tilt angles of these molecules with respect to the substrate surface were determined by the angular dependence of the Near Edge X-ray Absorption Fine Structure (NEXAFS) of the carbon K-edge. The interpretation of the NEXAFS spectra was assisted by a semi-empirical approach to the calculation of the π∗-transition region which employs density functional theory calculations and core level photoemission data. |
| |
Keywords: | DNA base Adenine Cytosine Guanine Molecular orientation Near edge X-ray absorption fine structure spectroscopy NEXAFS Core level Photoemission spectroscopy |
本文献已被 ScienceDirect 等数据库收录! |