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| 人造金刚石的介电性能与其强度的关系初探 | |
| 引用本文： | 陈叔鑫. 人造金刚石的介电性能与其强度的关系初探[J]. 高压物理学报, 1988, 2(3): 285-287 . doi: 10.11858/gywlxb.1988.03.013 |
| 作者姓名： | 陈叔鑫 |
| 作者单位： | 成都科技大学高温高压物理研究所，四川成都 610065 |
| 摘 要： | 人造金刚石的介电性能与其结构缺陷和强度存在一定关系，实验表明：用作电容器介质的人造金刚石晶形越完整，引起的电容量的增加就越小。 |
| 关 键 词： | 金刚石 介电性能 缺陷 |
| 收稿时间： | 1988-05-03; |
| 修稿时间： | 1988-05-03 |
A STUDY ON THE RELATION BETWEEN DIELECTRIC CHARACTERISTICS AND MECHANICAL STRENGTH OF SYNTHETIC DIAMOND |
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| CHEN Shu-Xin. A Study on the Relation between Dielectric Characteristics and Mechanical Strength of Synthetic Diamond[J]. Chinese Journal of High Pressure Physics, 1988, 2(3): 285-287 . doi: 10.11858/gywlxb.1988.03.013 | |
| Authors: | Chen Shuxin |
| Affiliation: | Institute of High-Temperature and High-Pressure Physics, Chengdu University of Science and Technology, Chengdu 610065, China |
| Abstract: | The dielectric characteristics of synthetic diamond are related to its structural defects and mechanical strength. Experiments performed in this work showed that for the diamond being used as medium of a capacitor the more complete the crystal form is, the less increase of the capacitance is. |
| Keywords: | diamond dielectric characteristics defect. |
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