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Soft X-ray magnetic circular dichroism of Cr-doped GaN |
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| Authors: | H. Makino J. J. Kim T. Nakamura T. Muro K. Kobayashi T. Yao |
| Affiliation: | a Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan;b Center for Interdisciplinary Research, Tohoku University, Sendai 980-8578, Japan;c Japan Synchrotron Radiation Research Institute, Mikazuki, Hyogo 679-5143, Japan |
| Abstract: | Soft X-ray magnetic circular dichroism (XMCD) have been measured for the Ga0.97Cr0.03N film grown by NH3-assisted molecular beam epitaxy. Temperature dependence of the XMCD intensity was well described by the Curie–Weiss law. Although the sample showed ferromagnetic behavior at least up to room temperature, the ferromagnetic component could not be detected by the XMCD measurement. |
| Keywords: | Gallium nitride X-ray magnetic circular dichroism Ferromagnetism Chromium |
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