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Performance analysis of 1300 nm SLEDs – impact of temperature and length scaling |
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| Authors: | Martin Loeser Lorenzo Occhi Christian Vélez Raffaele Rezzonico Bernd Witzigmann |
| Affiliation: | 1. Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8032, Zurich, Switzerland 2. Exalos AG, Wagistr. 21, CH-8952, Schlieren, Switzerland |
| Abstract: | The impact of self-heating and cavity length on the spectral emission properties of SLEDs is investigated using a state-of-the-art simulation tool. Simulated data are compared to measurements for two InP-based benchmark devices operating around 1300 nm, and excellent agreement is achieved in either case. |
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