Data and device protection: A ToF‐SIMS,wetting, and XPS study of an Apple iPod nano |
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Authors: | Vipul Gupta Joshua A Tuscano Naomi R Romriell Robert C Davis Matthew R Linford |
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Institution: | 1. Department of Chemistry and Biochemistry, Brigham Young University, , Provo, UT, 84602 USA;2. Department of Physics and Astronomy, Brigham Young University, , Provo, UT, 84602 USA |
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Abstract: | An important aspect of the robustness of an electronic device is its ability to resist water, fingerprints, dirt, and smudges that may compromise its ability to function and/or the information within it. Here, we report a chemical analysis by ToF‐SIMS, wetting, and XPS of the surfaces in a commercially available Apple iPod nano (8GB, MC525LL/A), which showed good resistance to its environment. This analysis reveals that the front panel (touchscreen) of the device is coated with a low free energy fluorinated polymer that may consist of short segments of a fluorinated hydrocarbon connected through ether linkages. No other part of the device appears to have this hydrophobic coating. A plasma treatment of the device leads to a deterioration of its performance. This work demonstrates how different analytical techniques can complement each other and contribute to a better understanding of a surface or a material. Copyright © 2013 John Wiley & Sons, Ltd. |
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Keywords: | Hydrophobic XPS ToF‐SIMS Wetting Touchscreen |
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