Ion implantation into fused quartz for integrated optical circuits |
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Authors: | R.Th. Kersten H. Boroffka |
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Affiliation: | Research Laboratories of Siemens AG, D-8000 Munich 70, Fed. Rep. Germany |
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Abstract: | ![]() Results obtained in the fabrication of slab and strip waveguides by ion implantation into fused quartz are discussed. Using a step-index waveguide model the increase in refractive index is calculated. The optical loss is smaller than 1 dB/cm at λ = 568 nm without annealing. The properties of strip waveguides fabricated by ion implantation through photoresist masks of thicknesses from 0.4 μm to 0.8 μm are described. A bright fluorescence is observed with emission at 530 nm and 640 nm and its dependence on ion fluence and ion energy is measured. |
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