Electrons and holes in HgTe and Hg0.82Cd0.18Te with controlled deviations from stoichiometry |
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Authors: | J. Nishizawa K. Suto M. Kitamura M. Sato Y. Takase A. Ito |
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Affiliation: | Research Institute of Electrical Communication, Tohoku University, Sendai, Japan;Semiconductor Research Institute, Sendai, Japan |
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Abstract: | The deviations from the stoichiometric composition of HgTe and Hg0.82Cd0.18Te crystals have been controlled by heat treatment under Hg vapor pressure. The magnetic field dependence of the Hall coefficient always shows the presence of two different sets of electrons and one set of holes. A low mobility electron is shown to belong to the conduction band. Vapor pressure dependence of hole concentration in HgTe shows that the concentration of nonstoichiometric defects decreases with increasing Hg vapor pressure, but the hole concentration is always higher than the electron concentration. In the case of Hg0.82Cd0.18Te, the electron concentration exceeds the hole concentration at high Hg vapor pressures. The dependence of the conduction band electron mobility in HgTe upon carrier density shows that the scattering by holes and impurities is predominant. In Hg0.82Cd0.18Te, however, optical phonon scattering is dominant when the deviation from stoichiometry is small and the effect of residual impurities can be neglected, and scattering by holes is dominant when the hole concentration is over . |
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