The effect of electron beam geometric deformation errors on the small-signal characteristic of ECRM |
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| Authors: | Yu Yongjian |
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| Institution: | (1) Department of Electronic Engineering, University of Electronic Science and Technology, Chengdu, People's Republic of China |
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| Abstract: | In this paper is studied the effect of electron beam geometric deformation errors on the small — signal characteristics of the TE
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mode Electron Cyclotron Resonance Maser (ECRM), based on the elliptically cross—sectional e—beam deformation model. As an example, the effect of small geometric deformation errors on the TE
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mode fundamental ECRM coupling coefficient is quantitatively shown. |
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| Keywords: | electron beam geometric deformation error elliptical ring cross— section beam dispersion relation coupling coefficient |
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