Combined breakdown in bismuth—Antimony semiconductor alloys

S-shaped current-voltage characteristics for Bi_1?xSb_x alloys are studied theoretically and experimentally. The phenomenon is shown to occur due to the combined interband breakdown, the impact ionization being caused both by the external electric field and the Hall field. The latter is governed by the proper magnetic field of the plasma current. The negative differential resistance (NDR) occurs for the range of currents where the impact ionization is growing intensively but the pinch effect is not yet developed to full extent. The phenomenon is enhanced if the impact ionization rate in the Hall field is greater than in the applied one.