Relative-thickness dependence of exchange bias in bilayers and trilayers |
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Authors: | Yong Hu Guo-Zhen Wu Yan LiuAn Du |
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Affiliation: | College of Sciences, Northeastern University, Shenyang 110819, China |
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Abstract: | ![]() We consider the models of ferromagnetic (FM)/antiferromagnetic (AFM) bilayers and trilayers and perform a modified Monte Carlo method to study their exchange bias (EB) properties at low temperature after field cooling on increasing one component thickness at the expense of the other one. The results indicate that EB is insensitive to the thickness variations as the FM layer is thicker than the AFM one. Otherwise, it has a steep increase with the decrease of FM thickness, but the purely inverse proportion is no longer valid due to the dual influences of FM and AFM thicknesses. EB in trilayers should be approximately twice larger than that in bilayers because there is a double interfacial area in the trilayers compared with the bilayers, but the dispersed FM/AFM distributions may break this relation as a result of thermal destabilization. Moreover, EB is independent of FM/AFM stacking sequences probably because of the ideal interface between them. It has been clarified unambiguously that such control of EB through varying the FM/AFM dimensions in heterostructures is attractive for spintronics applications. |
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Keywords: | Exchange bias Hysteresis Magnetic film Monte Carlo method |
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