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微小等离子体反应器的导出机理研究
引用本文:王海,童云华,文莉.微小等离子体反应器的导出机理研究[J].核聚变与等离子体物理,2011,31(1):91-96.
作者姓名:王海  童云华  文莉
作者单位:(1. 安徽工程大学机械与汽车工程学院,芜湖 241000;2. 安徽省先进数控和伺服驱动技术重点实验室,芜湖 241000;3. 中国科学技术大学精密机械与精密仪器系,合肥 230027)
基金项目:国家自然科学基金资助项目,江苏省微纳生物医疗器械设计与制造重点实验室资助
摘    要:An extraction mechanism based on micronozzle in the bottom of the microhollow cathode and applied bias electrical field is proposed, and digitally simulated with a two dimensional fluid model. When the operating gas is SF6 and its pressure is 2~9kPa, radius of the micronozzle is 0.25μm, maximum F atom flux density is between (1.53~5.62)×1014cm-3·s-1, maximum SF5+ flux density is between (2.46~7.83)×1016cm-3·s-1. When gas pressur is  5kPa,average energy of F atom at sample surface is 3.82eV, dispersion angle is ?14º~14º; average energy of SF is 25eV, dispersion angle is ?13º~14º. When applied voltage across hollow cathode and sample is between 10~50V (sample as cathode), average energy of SF is between 52~58eV. The density of F and SF in the simulation result could satisfy the requirement for silicon etching, and the feasibility of scanning plasma etching validated.

关 键 词:扫描等离子体刻蚀加工  微小等离子体反应器  导出机制  
收稿时间:2010-08-05
修稿时间:2010-11-23

Research of extraction mechanism for microplasma reactor
WANG Hai,TONG Yun-hua,WEN Li.Research of extraction mechanism for microplasma reactor[J].Nuclear Fusion and Plasma Physics,2011,31(1):91-96.
Authors:WANG Hai  TONG Yun-hua  WEN Li
Institution:(1. School of Mechanical and Automotive Engineering, Anhui Polytechnic University, Wuhu 241000; 2. Advanced Numerical Control & Servo Driving Technology Key Lab of Anhui, Wuhu 241000;3. Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027)
Abstract:An extraction mechanism based on micronozzle in the bottom of the microhollow cathode and applied bias electrical field is proposed, and digitally simulated with a two dimensional fluid model. When the operating gas is SF6 and its pressure is 2~9kPa, radius of the micronozzle is 0.25μm, maximum F atom flux density is between (1.53~5.62)×1014cm-3·s-1, maximum SF5+ flux density is between (2.46~7.83)×1016cm-3·s-1. When gas pressur is  5kPa,average energy of F atom at sample surface is 3.82eV, dispersion angle is ?14º~14º; average energy of SF
Keywords:Scanning plasma etching  Microplasma reactor  Extraction mechanism
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