The structure and electrical resistance of thin scandium films (II). F.C.C.–lattice phase observed in films obtained in a vacuum of 10−8 Torr

Phase composition of the Sc-films up to 200 Å thick obtained in a vacuum of 3 · 10⁻⁸ Torr, condensation rate being ω ⋍ 1 to 6 Å/s and ω ⋍ 40 å/s up to 10⁻⁷ Torr, have been studied by an electron-diffraction examination. A phase with an f.c.c.-lattice and a lattice parameter a = 4.76 to 4.80 ± 0.01 Å 0.01 Å is observed in films d ≲ 60 Å thick, whilst with films having a thickness d ≳ 90 Å a h.c.p.-phase is characteristic for solid specimens. Two-phase composition is observed in an interjacent interval of thicknesses. An analysis performed permitted to conclude that the f.c.c.-phase observed is a ScH_x-hydride forming during the post-condensation delay time on a basis of a poly-morphic modification.