Narrow spectral band monolithic lead-chalcogenide-on-Si mid-IR photodetectors |
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Authors: | H. Zogg M. Arnold |
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Affiliation: | (1) Thin Film Physics Group, Laboratory for Solid State Physics, Swiss Federal Institute of Technology (ETH), 1 Technopark Str., CH-8005 Zurich, Switzerland |
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Abstract: | Narrow spectral band infrared detectors are required for multispectral infrared imaging. Wavelength selectivity can be obtained by placing passive line filters in front of the detectors, or, the preferred choice, by making the detectors themselves wavelength selective. We review the first photovoltaic resonant cavity enhanced detectors (RCED) for the mid-IR range. The lead-chalcogenide (PbEuSe) photodetector is placed as a very thin layer inside an optical cavity. At least one side is terminated with an epitaxial Brugg mirror (consisting of quarter wavelength PbEuSe/BaF2 pairs), while the second mirror may be a metal. Linewidths are as narrow as 37 nm at a peak wavelength of 4400 nm, and peak quantum efficiencies up to above 50% are obtained. The paper presented there appears in Infrared Photoelectronics, edited by Antoni Rogalski, Eustace L. Dereniak, Fiodor F. Sizov, Proc. SPIE Vol. 5957, 59570B (2005). |
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Keywords: | infrared sensors resonant cavity lead-chalcogenides molecular beam epitaxy silicon substrates |
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