Two-dimensional strain measurement with ESPI

Optical techniques have been applied to the measurement of solid deformations in many instances. Practical difficulties with a particular technique can be overcome, in some circumstances, with attention to experimental detail. However, a common problem is the quantitative interpretation of the optical data thus obtained: this can be a time-consuming process and depends on the operator's skill. This paper describes an electronic speckle pattern interferometer that measures two in-plane displacement components simultaneously. The (phase-stepping) procedures implemented for automated displacement and strain analysis are described. Simultaneous measurement of the two displacement components is particularly important for shear strain measurement, because data from the two in-plane views must be combined. The accuracies of displacement and strain measurements are shown to be ±0·03 μm and ±6 μstrain, respectively. Results are presented for a compact tension specimen.