Application of surface chemical analysis tools for characterization of nanoparticles |
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| Authors: | D R Baer D J Gaspar P Nachimuthu S D Techane D G Castner |
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| Institution: | (1) Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352, USA;(2) Energy and Environment Directorate, Pacific Northwest National Laboratory, Richland, WA 99352, USA;(3) National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Bioengineering and Chemical Engineering, University of Washington, Seattle, WA 98195, USA |
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| Abstract: | The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is
described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy
(AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering
(LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM),
are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis
considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed
and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating,
etc., have on nanoparticle properties.
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