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Photodielectric Processes in ZnS : Cu Polycrystalline Layers
Authors:V. T. Avanesyan  A. V. Rakina  V. G. Pak  M. M. Sychev
Affiliation:1.Herzen State Pedagogical University of Russia,St. Petersburg,Russia;2.St. Petersburg State Technological Institute (Technical University),St. Petersburg,Russia
Abstract:The frequency dependences of dielectric parameters of zinc sulfide electroluminescent polycrystalline structures doped with copper are studied in the dark and under light excitation in the visible wavelength range. A positive photodielectric effect most pronounced in the low-frequency range was revealed. The experimental results are explained within framework of formation of a space charge in the bulk of a semiconductor. The analysis of data indicates they can be correlated with luminance characteristics of an electroluminescent layer.
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