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| Diagnosis of phasma in CCD damage process induced by laser | |
| 引用本文： | Jian Lu,Xiao wu Ni,An-zhi He(Department of Applied Physics,Nanjing University of Science Technology,200 Xiaolingwei,Nanjing 210014,China). Diagnosis of phasma in CCD damage process induced by laser[J]. Chinese Journal of Lasers, 1993, 2(5): 463-467 |
| 作者姓名： | Jian Lu Xiao wu Ni An-zhi He(Department of Applied Physics Nanjing University of Science Technology 200 Xiaolingwei Nanjing 210014 China) |
| 作者单位： | Department of Applied Physics，Nanjing University of Science Technology，200 Xiaolingwei，Nanjing 210014，China |
| 基金项目： | In this paper, the shapes of plasma produced by a Q -switched YAG laser acted repeatedly upon a CCD with MOS structure are used, to investigate the destroying process of the optoelectronic device. The experjmental results of CCD destroyed by a 1. 06μm laser beam with a pulse width of 15 ns are given. |
| 摘 要： | In this paper, the shapes of plasma produced by a Q-switched YAG laser acted repeatedly upon a CCD with MOS structure are used, to investigate the destroying process of the optoelectronic device. The experimental results of CCD destroyed by a 1.06μm laser beam with a pulse width of 15 ns are given. |
| 收稿时间： | 1993-05-19 |
Diagnosis of phasma in CCD damage process induced by laser |
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| Jian Lu,Xiao wu Ni,An-zhi He. Diagnosis of phasma in CCD damage process induced by laser[J]. 中国激光(英文版), 1993, 2(5): 463-467 | |
| Authors: | Jian Lu Xiao wu Ni An-zhi He |
| Abstract: | In this paper, the shapes of plasma produced by a Q-switched YAG laser acted repeatedly upon a CCD with MOS structure are used, to investigate the destroying process of the optoelectronic device. The experimental results of CCD destroyed by a 1.06μm laser beam with a pulse width of 15 ns are given. |
| Keywords: | CCD device MOS structure laser damage optical breakdown plasma |
| 本文献已被 CNKI 等数据库收录！ | |