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CEMS analysis of Fe thin films
Authors:M Przybylski  J Korecki  U Gradmann
Institution:1. Solid State Physics Department, Academy of Mining and Metallurgy, al. Mickiewicza 30, 30-059, Krakow, Poland
2. Physikalisches Institut der Technischen Universit?t Clausthal, Leibnizstrasse 4, 3392, Clausthal-Zellerfeld, Federal Republic of Germany
Abstract:The application of the Conversion Electron Mössbauer Spectroscopy (CEMS) to the structural and magnetic analysis of ultrathin films and their interfaces is reported. Fe(110) films were deposited on W(110) under UHV conditions and analyzed in situ using CEMS. The changes ofB hf from layer to layer across the film are discussed with respect to the modifications of magnetic properties caused both by the finite film thickness and by the specific electronic structure of the interfaces.
Keywords:
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